Description

The USB 2.0 Mass Storage Design Platform is a complete, integrated solution, dedicated to a wide range of USB-based Mass Storage Devices. You can use it in various applications, like portable flash memory, digital audio player, card reader or digital camera. The complete MS Design Platform includes:

  • DUSB2 peripheral controller designed to support 12 Mb/s “Full Speed” (FS) and 480 Mb/s “High Speed” (HS) serial data transmission rates
  • DP8051XP ultra high performance, speed optimized, fully customizable 8051 8-bit microcontrollers with built-in DoCD™ debug IP core
  • Mass Storage Devices software stack optimized for DP8051XP 8-bit CPU
  • FPGA board with ready-to-use, preprogrammed example flash memory device application
  • HAD2 – DoCD™ Hardware Assisted Debugger board
  • DoCD™ Debug Software
  • DoCD™ driver for Keil development software
  • DoCD™ driver for IAR development software

DESIGN FEATURES:

ALL DCD’S IP CORES ARE TECHNOLOGY INDEPENDENT WHICH MEANS THAT THEY ARE 100% COMPATIBLE WITH ALL FPGA & ASIC VENDORS E.G.

  • Altera / Intel,
  • Xilinx / AMD,
  • Lattice,
  • Microsemi / Microchip,
    and others.

  • TSMC
  • UMC
  • SK Hynix
    and others.

Key features

  • Full compliance with the USB 2.0 specification
  • Full-speed 12 Mbps operation
  • High-speed 480 Mbps operation
  • Supports UTMI Transceiver Macrocell Interface
  • Synchronous RAM interface for FIFOs
  • Suspend and resume power management functions
  • 100% software compatible with industry standard 8051
  • Up to 256 bytes of internal (on-chip) Data Memory
  • Up to 64K bytes of internal (on-chip) or external (off-chip) Program Memory
  • Up to 16M bytes of external (off-chip) Data Memory
  • User programmable Program Memory Wait States solution for wide range of memories speed
  • User programmable External Data Memory Wait States solution for wide range of memories speed
  • Allows operation from a wide range of CPU clock frequencies
  • Fully synthesizable
  • Static synchronous design
  • Positive edge clocking
  • No internal tri-states
  • Lite design, small gate count and fast operation
  • Scan test ready

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